139 pages • missing pub info (editions)
ISBN/UID: 9781598299410
Format: Paperback
Language: English
Publisher: Morgan & Claypool
Publication date: 16 March 2009
Description
Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block ci...
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139 pages • missing pub info (editions)
ISBN/UID: 9781598299410
Format: Paperback
Language: English
Publisher: Morgan & Claypool
Publication date: 16 March 2009
Description
Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block ci...
Community reviews
This book doesn't have any reviews or ratings yet!
If you've read it, mark it as 'read' and add a review to help others in the StoryGraph community figure out if it might be a book for them!
Content Warnings
This book doesn't have any content warnings yet!
If you're the author of this book and want to add author-approved content warnings, please email us at [email protected] to request the content warning form.